Published 2005 | Version v1
Miscellaneous

Flaw detection by spatially coded backscatter radiography

  • 1. Univ. of New Brunswick, Dept. of Mechanical Engineering, Fredericton, New Brunswick (Canada)

Description

Backscatter imaging is suited for the inspection of extended structures like airframes, bridge structures, floors etc., which cannot be inspected with conventional radiography. However indications obtained from backscattering are convoluted and difficult to interpret. The spatial coding technique used in astronomical physics to detect feeble emissions is investigated for the detection of the weak indications produced by the flaw in backscatter imaging. Spatial coding involves the positioning of a mask with open and closed holes (aperture) to selectively permit and block the passage of radiation. The obtained 'coded' indications are then mathematically decoded to detect the presence of anomalies. Monte Carlo simulations were employed to investigate the applicability of this technique. This paper introduces the coded aperture technique, describes how it is applied to scatter radiography, present the results obtained from the simulations and concludes with a discussion on future work. (author)

Part of:
26th Annual CNS conference; 29th CNS/CNA student conference

Additional details

Publishing Information

Publisher
Canadian Nuclear Society
Imprint Place
Toronto, Ontario (Canada)
ISBN
0-919784-82-8
Imprint Title
26th Annual CNS conference; 29th CNS/CNA student conference
Imprint Pagination
168 Megabytes
Journal Page Range
[11 p.]

Conference

Title
26. Annual CNS conference; 29. CNS/CNA student conference. Proceedings
Dates
12-15 Jun 2005
Place
Toronto, Ontario (Canada)

INIS

Country of Publication
Canada
Country of Input or Organization
Canada
INIS RN
38041963
Subject category
S42: ENGINEERING;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
BACKSCATTERING; DEFECTS; DIAGNOSTIC TECHNIQUES; INDUSTRIAL RADIOGRAPHY; MECHANICAL STRUCTURES; MONTE CARLO METHOD
Descriptors DEC
CALCULATION METHODS; MATERIALS TESTING; NONDESTRUCTIVE TESTING; SCATTERING; TESTING

Optional Information

Notes
10 refs., 9 figs.