Zn precipitation and Li depletion in Zn implanted ZnO
- 1. Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra, ACT 2601 (Australia)
- 2. Department of Physics/Centre for Materials Science and Nanotechnology, University of Oslo, P.O. Box 1048 Blindern, N-0316 Oslo (Norway)
- 3. Australian National Fabrication Facility, Research School of Physics and Engineering, The Australian National University, Canberra, ACT 2601 (Australia)
Description
Ion implantation of Zn substituting elements in ZnO has been shown to result in a dramatic Li depletion of several microns in hydrothermally grown ZnO. This has been ascribed to a burst of mobile Zn interstials. In this study, we seek to understand the reason behind this interstitial mediated transient enhanced diffusion in Li-containing ZnO samples after Zn implantation. ZnO wafers were implanted with Zn to two doses, 5 × 1015 cm−2 and 1 × 1017 cm−2. Secondary ion mass spectrometry was carried out to profile the Li depletion depth for different annealing temperatures between 600 and 800 °C. The 800 °C annealing had the most significant Li depletion of close to 60 μm. Transmission electron microscopy (TEM) was carried out in selected samples to identify the reason behind the Li depletion. In particular, TEM investigations of samples annealed at 750 °C show significant Zn precipitation just below the depth of the projected range of the implanted ions. We propose that the Zn precipitation is indicative of Zn supersaturation. Both the Li depletion and Zn precipitation are competing synchronous processes aimed at reducing the excess Zn interstitials.
Additional details
Identifiers
- DOI
- 10.1063/1.4958693;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 109
- Journal Issue
- 2
- Journal Page Range
- vp.
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48035145
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; DEPTH; INTERSTITIALS; MASS SPECTROSCOPY; PRECIPITATION; TEMPERATURE RANGE 0400-1000 K; TRANSMISSION ELECTRON MICROSCOPY; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIMENSIONS; ELECTRON MICROSCOPY; HEAT TREATMENTS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; POINT DEFECTS; SEPARATION PROCESSES; SPECTROSCOPY; TEMPERATURE RANGE; ZINC COMPOUNDS
Optional Information
- Notes
- (c) 2016 Author(s)