Published September 2005 | Version v1
Journal article Metadata-only

Enhanced contrast radiography with channel-cut crystals at the LNLS

Creators

  • 1. LORXI, Departamento de Fisica, Universidade Federal do Parana, Caixa Postal 19091, 81531-990 Curitiba-PR (Brazil)
  • 2. LIN, COPPE-Universidade Federal do Rio de Janeiro, Caixa Postal 68509, 21945-970 Rio de Janeiro-RJ (Brazil)
  • 3. LORXI, Departamento de Fisica, Universidade Federal do Parana, Caixa Postal 19091, 81531-990 Curitiba-PR (Brazil) and FaMAF, Universidade Nacional de Cordoba, 5000 Cordoba (Argentina)
  • 4. Laboratorio Nacional de Luz Sincrotron (LNLS), Caixa Postal 6192, 13084-971 Campinas-SP (Brazil) and Instituto de Fisica Gleb Wataghin, Universidade Estadual de Campinas, Caixa Postal 6165, 13083-970 Campinas-SP (Brazil)
  • 5. Laboratorio Nacional de Luz Sincrotron (LNLS), Caixa Postal 6192, 13084-971 Campinas-SP (Brazil)

Description

An analyzer-based x-ray phase contrast imaging (PCI) setup based on channel-cut crystals at the Laboratorio Nacional de Luz Sincrotron (LNLS--Brazilian Synchrotron) is presented. The contrast, visibility, signal-to-noise ratio and spatial resolution of the acquired images were characterized. The potential of PCI for enhancing details of different features with the same x-ray attenuation coefficient is exploited together with cross section simulations of the PCIs acquired at different angular positions on the rocking curve (RC). The present results show that this setup can be used as a standard PCI setup at the LNLS

Additional details

Identifiers

DOI
10.1063/1.2018456;

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
76
Journal Issue
9
Journal Page Range
p. 093703-093703.6
ISSN
0034-6748
CODEN
RSINAK

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37035633
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ATTENUATION; COMPUTERIZED SIMULATION; CRYSTALS; IMAGES; NEUTRON DIFFRACTION; SIGNAL-TO-NOISE RATIO; SPATIAL RESOLUTION; SYNCHROTRONS; VISIBILITY; X RADIATION; X-RAY RADIOGRAPHY
Descriptors DEC
ACCELERATORS; COHERENT SCATTERING; CYCLIC ACCELERATORS; DIFFRACTION; DIMENSIONLESS NUMBERS; ELECTROMAGNETIC RADIATION; INDUSTRIAL RADIOGRAPHY; IONIZING RADIATIONS; MATERIALS TESTING; NONDESTRUCTIVE TESTING; RADIATIONS; RESOLUTION; SCATTERING; SIMULATION; TESTING

Optional Information

Notes
(c) 2005 American Institute of Physics