Development of a Mach-Zehnder type electron interferometer on a 1.2-MV field-emission transmission electron microscope
- 1. Hitachi, Ltd., Research & Development Group, Hatoyama, Saitama (Japan)
- 2. RIKEN, Center for Emergent Matter Science (CEMS), Hatoyama, Saitama (Japan)
Description
We have developed an amplitude-division type Mach-Zehnder electron interferometer (MZ-EI). The developed MZ-EI is composed of single crystals corresponding to amplitude-division beam splitters, lenses corresponding to mirrors and an objective aperture. The spacings and azimuth angles of interference fringes can be controlled by single crystal materials and their orientations and by diffraction spots selected by the objective aperture. We built the MZ-EI on a 1.2-MV field-emission transmission electron microscope and tested its performance. Results showed that interference fringes were created for various spacings and azimuth angles, which demonstrates the practicability of the MZ-EI as an amplitude-division type electron interferometer. (author)
Availability note (English)
Available from DOI: https://doi.org/10.1093/jmicro/dfaa040Additional details
Identifiers
Publishing Information
- Journal Title
- Microscopy (Online)
- Journal Volume
- 69
- Journal Issue
- 6
- Journal Page Range
- p. 411-416
- ISSN
- 2050-5701
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 52100670
- Subject category
- S36: MATERIALS SCIENCE; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- BEAM SPLITTING; BRAGG REFLECTION; ELECTRON BEAMS; ELECTRON DIFFRACTION; ELECTRON GUNS; FCC LATTICES; FIELD EMISSION; GRAIN ORIENTATION; MACH-ZEHNDER INTERFEROMETER; MAGNETIC LENS SPECTROMETERS; MONOCRYSTALS; POWER SUPPLIES; SPACE DEPENDENCE; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- BEAMS; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CRYSTALS; CUBIC LATTICES; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRONIC EQUIPMENT; EMISSION; EQUIPMENT; INTERFEROMETERS; LEPTON BEAMS; MAGNETIC SPECTROMETERS; MEASURING INSTRUMENTS; MICROSCOPY; MICROSTRUCTURE; ORIENTATION; PARTICLE BEAMS; REFLECTION; SCATTERING; SPECTROMETERS; THREE-DIMENSIONAL LATTICES
Optional Information
- Notes
- 13 refs., 4 figs.