Published December 2020 | Version v1
Journal article

Development of a Mach-Zehnder type electron interferometer on a 1.2-MV field-emission transmission electron microscope

  • 1. Hitachi, Ltd., Research & Development Group, Hatoyama, Saitama (Japan)
  • 2. RIKEN, Center for Emergent Matter Science (CEMS), Hatoyama, Saitama (Japan)

Description

We have developed an amplitude-division type Mach-Zehnder electron interferometer (MZ-EI). The developed MZ-EI is composed of single crystals corresponding to amplitude-division beam splitters, lenses corresponding to mirrors and an objective aperture. The spacings and azimuth angles of interference fringes can be controlled by single crystal materials and their orientations and by diffraction spots selected by the objective aperture. We built the MZ-EI on a 1.2-MV field-emission transmission electron microscope and tested its performance. Results showed that interference fringes were created for various spacings and azimuth angles, which demonstrates the practicability of the MZ-EI as an amplitude-division type electron interferometer. (author)

Availability note (English)

Available from DOI: https://doi.org/10.1093/jmicro/dfaa040

Additional details

Identifiers

Publishing Information

Journal Title
Microscopy (Online)
Journal Volume
69
Journal Issue
6
Journal Page Range
p. 411-416
ISSN
2050-5701

Optional Information

Notes
13 refs., 4 figs.