The influence of Cd content on kinetics of the low-temperature structural transformation in In-Cd alloys
- 1. Institute for Low Temperature Physics and Engineering, Kharkiv (Ukraine)
Description
The influence of Cd content on the kinetics of spontaneous low-temperature structural transformation previously observed in the martensitic phase of the In-Cd solid solution has been investigated. In the temperature range 100-340 K, the acoustical, resistivity and calorimetric measurements were carried out on specimens containing 4.3, 5.5 and 6.6 at.% Cd. It is established that the transformation rate increases dramatically with increasing Cd content. The main empiric activation parameters of the transformation are obtained: the activation energy is U0 = 0.43 eV, the attempt period is τ0 =5·10-9s. It is shown that the transformation has the features typical of the 1-st order phase transition. It is supposed that the low-temperature isothermal instability of the macroscopic properties of the alloy is caused by the In-based solid solution decomposition. Essential increase of the decomposition rate with increasing Cd content may be due to an enhancement of the transformation driving force.
Additional details
Additional titles
- Original title (Russian)
- Влияние содержания CD на кинетику низкотемпературного структурного превращения в сплаве Ин-Cд
Publishing Information
- Journal Title
- Fizika Nizkikh Temperatur
- Journal Volume
- 36
- Journal Issue
- 3
- Journal Page Range
- p. 343-351
- ISSN
- 0132-6414
INIS
- Country of Publication
- Ukraine
- Country of Input or Organization
- Ukraine
- INIS RN
- 42104418
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ACOUSTIC TESTING; CADMIUM ALLOYS; INDIUM BASE ALLOYS; PHASE TRANSFORMATIONS; SOLID SOLUTIONS; STOICHIOMETRY; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K; YOUNG MODULUS
- Descriptors DEC
- ALLOYS; DISPERSIONS; HOMOGENEOUS MIXTURES; INDIUM ALLOYS; MATERIALS TESTING; MECHANICAL PROPERTIES; MIXTURES; NONDESTRUCTIVE TESTING; SOLUTIONS; TEMPERATURE RANGE; TESTING