Magnetic imaging with full-field soft X-ray microscopies
Creators
- 1. Center for X-ray Optics, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720 (United States)
- 2. Department of Materials Science and Engineering, University of California Berkeley, Berkeley, CA 94720 (United States)
- 3. Material Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94270 (United States)
- 4. Department of Physics, University of California Berkeley, Berkeley, CA 94720 (United States)
- 5. Department of Energy Systems Engineering, Daegu Gyeongbuk Institute of Science and Technology (DGIST), Daegu 711-873 (Korea, Republic of)
- 6. Department of Physics, University of California Davis, Davis, CA 95616 (United States)
Description
Progress toward a fundamental understanding of magnetism continues to be of great scientific interest and high technological relevance. To control magnetization on the nanoscale, external magnetic fields and spin polarized currents are commonly used. In addition, novel concepts based on spin manipulation by electric fields or photons are emerging which benefit from advances in tailoring complex magnetic materials. Although the nanoscale is at the very origin of magnetic behavior, there is a new trend toward investigating mesoscale magnetic phenomena, thus adding complexity and functionality, both of which will become crucial for future magnetic devices. Advanced analytical tools are thus needed for the characterization of magnetic properties spanning the nano- to the meso-scale. Imaging magnetic structures with high spatial and temporal resolution over a large field of view and in three dimensions is therefore a key challenge. A variety of spectromicroscopic techniques address this challenge by taking advantage of variable-polarization soft X-rays, thus enabling X-ray dichroism effects provide magnetic contrast. These techniques are also capable of quantifying in an element-, valence- and site-sensitive way the basic properties of ferro(i)- and antiferro-magnetic systems, such as spin and orbital moments, spin configurations from the nano- to the meso-scale and spin dynamics with sub-ns time resolution. This paper reviews current achievements and outlines future trends with one of these spectromicroscopies, magnetic full field transmission soft X-ray microscopy (MTXM) using a few selected examples of recent research on nano- and meso-scale magnetic phenomena. The complementarity of MTXM to X-ray photoemission electron microscopy (X-PEEM) is also emphasized
Availability note (English)
Available from http://dx.doi.org/10.1016/j.elspec.2013.03.012Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2013.03.012;
- PII
- S0368-2048(13)00053-4;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 189
- Journal Page Range
- p. 196-205
- ISSN
- 0368-2048
- CODEN
- JESRAW
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45050912
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ELECTRIC FIELDS; ELECTRON MICROSCOPY; EMISSION SPECTROSCOPY; MAGNETIC FIELDS; MAGNETIC MATERIALS; MAGNETIC PROPERTIES; MAGNETISM; MAGNETIZATION; NANOSTRUCTURES; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; PHOTONS; POLARIZATION; SOFT X RADIATION; SPIN; SPIN ORIENTATION; TIME RESOLUTION
- Descriptors DEC
- ANGULAR MOMENTUM; BOSONS; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; EMISSION; IONIZING RADIATIONS; MASSLESS PARTICLES; MATERIALS; MICROSCOPY; ORIENTATION; PARTICLE PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; RESOLUTION; SECONDARY EMISSION; SPECTROSCOPY; TIMING PROPERTIES; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.