Published May 1, 2018
| Version v1
Journal article
Preparation Poly 4-Bromoaniline Thin Films by Electro Deposition Technique for Hydrogen gas sensor
- 1. Ministry of High Education- Baghdad University, Ministry of Science and Technology *, Iraq. (Iraq)
Description
Thin films of Poly 4-bromoaniline organic Semiconductor polymer were prepared using electro deposition technique through oxidation polymerization by adding (2ml) HCl concentrated and (50) ml of Ammonium per sulfate concentrated (0.05M) to (50)ml of 4- bromoaniline (0.04M) at room temperature, The polymer was deposited on Silicon n-type substrate, Structural and optical properties of The thin films were characterized by technique: X-ray diffraction (XRD), (FE-SEM), Fourier transform infrared (FT-IR) spectroscopy, Field emission scanning electron microscopy, uv-visb spectroscopy and sensing of thin film to H2 gas. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/1032/1/012063Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 1032
- Journal Issue
- 1
- Journal Page Range
- [9 p.]
- ISSN
- 1742-6596
Conference
- Title
- 6. Scientific Conference on Renewable Energy and its Applications
- Dates
- 21-22 Feb 2018
- Place
- Karbala (Iraq)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52082695
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMMONIUM SULFATES; ELECTRODEPOSITION; FOURIER TRANSFORM SPECTROMETERS; HYDROCHLORIC ACID; HYDROGEN; N-TYPE CONDUCTORS; OPTICAL PROPERTIES; ORGANIC SEMICONDUCTORS; OXIDATION; POLYMERIZATION; POLYMERS; SCANNING ELECTRON MICROSCOPY; SILICON; SPECTROSCOPY; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- AMMONIUM COMPOUNDS; CHEMICAL REACTIONS; CHLORINE COMPOUNDS; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTROLYSIS; ELECTRON MICROSCOPY; ELEMENTS; FILMS; HALOGEN COMPOUNDS; HYDROGEN COMPOUNDS; INORGANIC ACIDS; INORGANIC COMPOUNDS; LYSIS; MATERIALS; MEASURING INSTRUMENTS; MICROSCOPY; NONMETALS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; SEMICONDUCTOR MATERIALS; SEMIMETALS; SPECTROMETERS; SULFATES; SULFUR COMPOUNDS; SURFACE COATING