The etching of alpha-recoil tracks in phlogopite
- 1. State Key Laboratory of Geological Processes and Mineral Resources, China University of Geosciences, Beijing 100083 (China)
- 2. Laboratory of Nuclear Analysis Techniques, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100039 (China)
- 3. Taiyuan University of Technology, Taiyuan 030024 (China)
Description
This work uses three phlogopite samples to investigate the etching behavior of alpha-recoil tracks (α-recoil tracks), which is a key problem in dating procedures. At the initial stage of the etching process, the number of alpha-recoil tracks increased linearly with etching time, then the linearity was interrupted due to the overlapping of alpha-recoil tracks. The slope of the etching line could be similar and also could be different both in the same sample and in different samples. It is shown that the etching time could vary with different contents of U and Th and could not exceed 200 min in 4% HF acid at 25±10C in order to get a satisfactory etching line and to calculate the exact density. We propose two valid methods that can accurately determine the position of the sample's surface and may reduce the alpha-recoil track dating errors
Availability note (English)
Available from http://dx.doi.org/10.1016/j.radmeas.2008.04.049Additional details
Identifiers
- DOI
- 10.1016/j.radmeas.2008.04.049;
- PII
- S1350-4487(08)00221-7;
Publishing Information
- Journal Title
- Radiation Measurements
- Journal Volume
- 43
- Journal Issue
- suppl.1
- Journal Page Range
- p. S353-S356
- ISSN
- 1350-4487
- CODEN
- RMEAEP
Conference
- Title
- 23. international conference on nuclear tracks in solids
- Dates
- 11-15 Sep 2006
- Place
- Beijing (China)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40008308
- Subject category
- S58: GEOSCIENCES;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AGE ESTIMATION; DENSITY; ERRORS; ETCHING; HYDROFLUORIC ACID; PARTICLE TRACKS; RECOILS
- Descriptors DEC
- FLUORINE COMPOUNDS; HALOGEN COMPOUNDS; HYDROGEN COMPOUNDS; INORGANIC ACIDS; INORGANIC COMPOUNDS; PHYSICAL PROPERTIES; SURFACE FINISHING
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.