Fabrication of nano-pits and the measurement of their local surface potentials
- 1. Nanomaterials Laboratory, National Institute for Materials Science, 3-13 Sakura, Tsukuba, Ibaraki 305-0003 (Japan)
Description
An Au(1 1 1) surface was irradiated with 500 eV argon ions in a controlled manner to fabricate nano-pits. The surface morphology of nano-pits formed after 6 ML removal by ion irradiation under various temperatures was studied with STM. The depth distribution of pits at various irradiation temperatures was analyzed. There was a specific irradiation temperature at which the depth of pits became very deep in comparison with other temperatures. The results were compared with other fcc metals. The local barrier height (LBH) on surfaces with pits was measured. The LBH images were compared with the topographic images. The width where surface potential was modified near steps was found wider than the topographic width of steps. For pits lager than the critical size, the LBH value at the bottom of pits was same as that on a flat terrace except at step edges
Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2004.09.033;
- PII
- S0169-4332(04)01384-4;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 241
- Journal Issue
- 1-2
- Journal Page Range
- p. 157-163
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- 9. international symposium on advanced physical fields
- Acronym
- APF-9
- Dates
- 1-4 Mar 2004
- Place
- Tsukuba (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38060537
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARGON IONS; EV RANGE 100-1000; FCC LATTICES; GOLD; IRRADIATION; SCANNING TUNNELING MICROSCOPY; SURFACE POTENTIAL; SURFACES
- Descriptors DEC
- CHARGED PARTICLES; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CUBIC LATTICES; ELEMENTS; ENERGY RANGE; EV RANGE; IONS; METALS; MICROSCOPY; POTENTIALS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.