Published February 28, 2005 | Version v1
Journal article

Fabrication of nano-pits and the measurement of their local surface potentials

  • 1. Nanomaterials Laboratory, National Institute for Materials Science, 3-13 Sakura, Tsukuba, Ibaraki 305-0003 (Japan)

Description

An Au(1 1 1) surface was irradiated with 500 eV argon ions in a controlled manner to fabricate nano-pits. The surface morphology of nano-pits formed after 6 ML removal by ion irradiation under various temperatures was studied with STM. The depth distribution of pits at various irradiation temperatures was analyzed. There was a specific irradiation temperature at which the depth of pits became very deep in comparison with other temperatures. The results were compared with other fcc metals. The local barrier height (LBH) on surfaces with pits was measured. The LBH images were compared with the topographic images. The width where surface potential was modified near steps was found wider than the topographic width of steps. For pits lager than the critical size, the LBH value at the bottom of pits was same as that on a flat terrace except at step edges

Additional details

Identifiers

DOI
10.1016/j.apsusc.2004.09.033;
PII
S0169-4332(04)01384-4;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
241
Journal Issue
1-2
Journal Page Range
p. 157-163
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
9. international symposium on advanced physical fields
Acronym
APF-9
Dates
1-4 Mar 2004
Place
Tsukuba (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38060537
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ARGON IONS; EV RANGE 100-1000; FCC LATTICES; GOLD; IRRADIATION; SCANNING TUNNELING MICROSCOPY; SURFACE POTENTIAL; SURFACES
Descriptors DEC
CHARGED PARTICLES; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CUBIC LATTICES; ELEMENTS; ENERGY RANGE; EV RANGE; IONS; METALS; MICROSCOPY; POTENTIALS; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.