A comparison between Geant4 PIXE simulations and experimental data for standard reference samples
Creators
- 1. The Open University, Faculty of Science, Department of Physical Sciences, Walton Hall, MK7 6AA Milton Keynes (United Kingdom)
- 2. Université Saint Joseph, Faculty of Science, Department of Physics, Beirut (Lebanon)
- 3. Ion Beam Analysis Laboratory, Lebanese Atomic Energy Commission, National Council for Scientific Research, Beirut (Lebanon)
- 4. Université Saint Joseph, Faculty of Science, Department of Mathematics, Beirut (Lebanon)
- 5. Istituto Nazionale di Fisica Nucleare, sez. di Genova, via Dodecaneso 33, 16146 Genova (Italy)
- 6. Université Bordeaux 1, CNRS/IN2P3, Centre d'Etudes Nucléaires de Bordeaux-Gradignan, CENBG, Chemin du Solarium, 33175 Gradignan (France)
- 7. Geant4 Associates International Ltd., Hebden Bridge (United Kingdom)
- 8. Ecoanalytica, Moscow State University, 119899 Moscow (Russian Federation)
- 9. Institut Pluridisciplinaire Hubert Curien, CNRS/IN2P3, 67037 Strasbourg Cedex (France)
- 10. Instituto de Física Gleb Wataghin, Universidade Estadual de Campinas-UNICAMP, SP 13083-859 (Brazil)
Description
The Geant4 PIXE de-excitation processes are used to simulate proton beam interactions with sample materials of known composition. Simulations involve four mono-elemental materials; Cu, Fe, Si and Al and three relatively complex materials: stainless steel, phosphor bronze and basal BE-N reference material composed of 25 different elements. The simulation results are compared to experimental spectra acquired for real samples analyzed using 3 MeV incident protons delivered by an ion tandem accelerator. Data acquisition was performed using a Si(Li) detector and an aluminum funny filter was added for the three last mentioned samples depending on the configuration to reduce the noise and obtain clear resulting spectrum. The results show a good agreement between simulations and measurements for the different samples
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2013.08.006Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2013.08.006;
- PII
- S0168-583X(13)00810-0;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 316
- Journal Page Range
- p. 1-5
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45067598
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ALUMINIUM; BRONZE; COMPARATIVE EVALUATIONS; DATA ACQUISITION; EXPERIMENTAL DATA; LI-DRIFTED SI DETECTORS; MATERIALS; MEV RANGE; MONTE CARLO METHOD; PIXE ANALYSIS; PROTON BEAMS; PROTONS; SIMULATION; STAINLESS STEELS; TANDEM ELECTROSTATIC ACCELERATORS
- Descriptors DEC
- ACCELERATORS; ALLOYS; BARYONS; BEAMS; CALCULATION METHODS; CARBON ADDITIONS; CHEMICAL ANALYSIS; COPPER ALLOYS; COPPER BASE ALLOYS; DATA; ELECTROSTATIC ACCELERATORS; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; EVALUATION; FERMIONS; HADRONS; HIGH ALLOY STEELS; INFORMATION; IRON ALLOYS; IRON BASE ALLOYS; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; METALS; NONDESTRUCTIVE ANALYSIS; NUCLEON BEAMS; NUCLEONS; NUMERICAL DATA; PARTICLE BEAMS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; STEELS; TIN ALLOYS; TRANSITION ELEMENT ALLOYS; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.