Optical thermometry based fluorescence intensity ratio in Y2Mg2Al2Si2O12:Bi3+,Eu3+ phosphors
Creators
- 1. Department of Physics, Zhejiang Normal University, Jinhua, 321004 (China)
Description
Highlights: • The preparation technology of Y2Mg2Al2Si2O12:Bi3+,Eu3+ phosphors is simple. • The main emission peak of Eu3+ and emission band of Bi3+ are well separated. • Y2Mg2Al2Si2O12:Bi3+,Eu3+ phosphors exhibit excellent thermal stability. • Relative sensitivity Sr accelerates with rising temperature. -- Abstract: An array of Y2Mg2Al2Si2O12:Bi3+,Eu3+ phosphors were successfully manufactured. The crystal phase, microscopic image and optical properties were systematically surveyed with X-ray diffraction patterns, scanning electron microscopy and fluorescence spectra, respectively. Under 282 nm excitation, for Y2Mg2Al2Si2O12:Bi3+ phosphors, a broadband emission center located at 319 nm was observed, which is derived from the 3P1 → 1S0 transition. For Bi3+/Eu3+ co-doped samples, besides the 319 nm emission of Bi3+, a range of characteristic sharp lines of Eu3+ were observed. Meanwhile, the maximum efficiency of energy transfer (Bi3+ → Eu3+) can arrive to 89.5%. According to the emission spectra at different temperature, the samples present an excellent temperature sensing property based on fluorescence (from Bi3+ and Eu3+) intensity ratio and thermal stability. The maximum relative sensitivity Sr reaches to 0.544 %K−1 at 573 K. The emission intensity at 483 K maintains 95.5% of that at 303 K. All above meaningful results indicate that the samples may have certain application value in the field of temperature measurement.
Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2021.161010;
- PII
- S0925838821024191;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 885
- Journal Page Range
- vp.
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55032495
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BISMUTH IONS; CARBON MONOXIDE; DOPED MATERIALS; EMISSION SPECTRA; EMISSIVITY; ENERGY TRANSFER; EUROPIUM IONS; FLUORESCENCE SPECTROSCOPY; PHOSPHORS; SCANNING ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- CARBON COMPOUNDS; CARBON OXIDES; CHALCOGENIDES; CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; EMISSION SPECTROSCOPY; IONS; MATERIALS; MICROSCOPY; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; SPECTRA; SPECTROSCOPY; SURFACE PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2021 Elsevier B.V. All rights reserved.