Published June 26, 2000 | Version v1
Journal article

Hard x-ray reflectivity of spherically bent mica crystals

  • 1. European Synchrotron Radiation Facility, BP 220, 38043 Grenoble Cedex (France)
  • 2. Multicharged Ions Spectra Data Center of VNIIFTRI, Mendeleevo, Moscow region 141570 (Russian Federation)

Description

Mica crystals are used as soft x-ray and neutron monochromators, as well as for imaging applications, in particular for plasma x-ray diagnostics. Although the d-spacing for mica is large (2d=19.88 Aa), it can be used for hard x-ray applications by exploiting the large number of intense high diffraction orders. We have measured diffraction profiles of mica crystals at the ESRF BM5 beamline to study the suitability of these crystals for hard x-ray applications. Two good quality mica crystal curved following an spherical shape with curvature radii of 10 and 15 cm were analyzed. A micrometry incident beam was prepared to avoid smearing the rocking curve with the angular spread induced by the beam projection on the crystal surface. Many diffraction orders from with indices from (0,0,6) to (0,0,38) were recorded at photon energies of 12, 16 and 20 keV

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
521
Journal Issue
1
Journal Page Range
p. 287-292
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
11. US national conference on synchrotron radiation instrumentation
Acronym
SRI99
Dates
13-15 Oct 1999
Place
Stanford, CA (United States)

Optional Information

Notes
(c) 2000 American Institute of Physics.