Published February 1, 2009
| Version v1
Journal article
Influence of substrate temperature on the texture of barium ferrite film by magnetron sputtering
Creators
- 1. State Key Laboratory of Thin Films and Integrated Devices, University of Electronic Science and Technology of China, No. 4, North Jiangshe Road, Chengdu 610054 (China)
Description
Barium ferrite thin films have been prepared by radio frequency magnetron sputtering on a sapphire (0 0 1) substrate at substrate temperature of 500 deg. C and 650 deg. C, respectively. The films were further annealed in air at 1000 deg. C for 5 h. X-ray diffraction shows that the films at the lower substrate temperatures have a good epitaxial relation with respect to the substrate, while the samples under the higher substrate temperatures have (1 0 9) planes parallel to the substrate. The remanence ratio decreases from 0.82 to 0.47 when the substrate temperature is increased. We attribute the variation of the growth direction to the enhanced vertical mobility of the deposited atoms when the substrate temperature is increased.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2008.11.044Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2008.11.044;
- PII
- S0169-4332(08)02400-8;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 255
- Journal Issue
- 8
- Journal Page Range
- p. 4443-4445
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44009143
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AIR; ANNEALING; BARIUM COMPOUNDS; EPITAXY; FERRITES; MAGNETRONS; RADIOWAVE RADIATION; SAPPHIRE; SPUTTERING; SUBSTRATES; TEMPERATURE RANGE 0400-1000 K; TEXTURE; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; COHERENT SCATTERING; CORUNDUM; CRYSTAL GROWTH METHODS; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; FERRIMAGNETIC MATERIALS; FILMS; FLUIDS; GASES; HEAT TREATMENTS; IRON COMPOUNDS; MAGNETIC MATERIALS; MATERIALS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; MINERALS; OXIDE MINERALS; OXYGEN COMPOUNDS; RADIATIONS; SCATTERING; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.