Published August 1, 2014 | Version v1
Journal article Metadata-only

Probing the A1 to L10 transformation in FeCuPt using the first order reversal curve method

Creators

  • 1. Physics Department, University of California, Davis, California 95616 (United States)
  • 2. Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu, Taiwan (China)
  • 3. National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)
  • 4. Seagate Technology, Fremont, California 94538 (United States)

Description

The A1-L10 phase transformation has been investigated in (001) FeCuPt thin films prepared by atomic-scale multilayer sputtering and rapid thermal annealing (RTA). Traditional x-ray diffraction is not always applicable in generating a true order parameter, due to non-ideal crystallinity of the A1 phase. Using the first-order reversal curve (FORC) method, the A1 and L10 phases are deconvoluted into two distinct features in the FORC distribution, whose relative intensities change with the RTA temperature. The L10 ordering takes place via a nucleation-and-growth mode. A magnetization-based phase fraction is extracted, providing a quantitative measure of the L10 phase homogeneity

Additional details

Identifiers

DOI
10.1063/1.4894197;
arXiv
arXiv:1408.2860v1;

Publishing Information

Journal Title
APL Materials
Journal Volume
2
Journal Issue
8
Journal Page Range
p. 086106-086106.7
ISSN
2166-532X
CODEN
AMPADS

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46009731
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ANNEALING; MAGNETIZATION; NUCLEATION; ORDER PARAMETERS; PHASE TRANSFORMATIONS; SPUTTERING; THIN FILMS; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; DIMENSIONLESS NUMBERS; FILMS; HEAT TREATMENTS; SCATTERING

Optional Information

Notes
(c) 2014 Author(s)