Effects of annealing temperature on morphology and thickness of samarium electrodeposited thin films
- 1. Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- 2. Texas A & M University, College Station, TX (United States)
Description
Electroplated depositions of Sm were prepared using a vertical well-type electrodeposition unit with an aqueous ammonium acetate electrolyte system, with an average deposition yield just over 87%. The depositions were analyzed for morphology and thickness by scanning electron microscopy (SEM) and chemical composition by energy dispersion X-ray spectroscopy (EDS) and X-ray photoelectron spectroscopy (XPS) before and after firing. The depositions were fired at 125–700 °C, while varying the heating rate from 0.5 to 10 °C/min in either an oxidizing or reducing atmosphere. A heating rate of 10 °C/min was slow enough to prevent disruption of the deposition morphology during firing. Furthermore, a gas sweep enhanced the removal of any organic substituents, with an oxidizing environment being more advantageous than a reducing environment
Availability note (English)
Available from http://www.osti.gov/pages/biblio/1255664Additional details
Additional titles
- Augmented title (English)
- KEYWORDS: ELECTRODEPOSITION; SAMARIUM; ELECTROPLATED DEPOSITION; THIN FILM
Identifiers
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 830
- Journal Issue
- C
- Journal Page Range
- p. 95-101
- ISSN
- 0168-9002
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- United States
- INIS RN
- 48002528
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CHEMICAL COMPOSITION; ELECTRODEPOSITION; MORPHOLOGY; SAMARIUM; SCANNING ELECTRON MICROSCOPY; THICKNESS; THIN FILMS; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- DEPOSITION; DIMENSIONS; ELECTROLYSIS; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; LYSIS; METALS; MICROSCOPY; PHOTOELECTRON SPECTROSCOPY; RARE EARTHS; SPECTROSCOPY; SURFACE COATING
Optional Information
- Contract/Grant/Project number
- AC05-00OR22725
- Funding organization
- USDOE Office of Nuclear Energy - NE (United States)
- Secondary number(s)
- OSTIID--1255664