Published 2016 | Version v1
Journal article

Effects of annealing temperature on morphology and thickness of samarium electrodeposited thin films

  • 1. Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
  • 2. Texas A & M University, College Station, TX (United States)

Description

Electroplated depositions of Sm were prepared using a vertical well-type electrodeposition unit with an aqueous ammonium acetate electrolyte system, with an average deposition yield just over 87%. The depositions were analyzed for morphology and thickness by scanning electron microscopy (SEM) and chemical composition by energy dispersion X-ray spectroscopy (EDS) and X-ray photoelectron spectroscopy (XPS) before and after firing. The depositions were fired at 125–700 °C, while varying the heating rate from 0.5 to 10 °C/min in either an oxidizing or reducing atmosphere. A heating rate of 10 °C/min was slow enough to prevent disruption of the deposition morphology during firing. Furthermore, a gas sweep enhanced the removal of any organic substituents, with an oxidizing environment being more advantageous than a reducing environment

Availability note (English)

Available from http://www.osti.gov/pages/biblio/1255664

Additional details

Additional titles

Augmented title (English)
KEYWORDS: ELECTRODEPOSITION; SAMARIUM; ELECTROPLATED DEPOSITION; THIN FILM

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
830
Journal Issue
C
Journal Page Range
p. 95-101
ISSN
0168-9002

Optional Information

Contract/Grant/Project number
AC05-00OR22725
Funding organization
USDOE Office of Nuclear Energy - NE (United States)
Secondary number(s)
OSTIID--1255664