Published May 1, 2016
| Version v1
Journal article
Structural analysis of NiO nanocluster catalysts on SiO2 by using XAFS measurements
Creators
- 1. Department of Applied Chemistry and Biotechnology, Graduate School of Engineering, Chiba University, Yayoi-cho, Inage-ku, Chiba 263-8522 (Japan)
Description
NiO nanocluster catalysts were prepared on a SiO2 support. Ni K-edge XAFS analysis revealed that the combined structure of NiO and Ni-silicate formed by using [Ni(NH3)6]2+ as a precursor, whereas pure NiO formed by using Ni-acetylacetonate or Ni- nitrate as a precursor. The obtained NiO nanocluster on Ni-silicate showed the catalytic activity for the oxidative coupling of thiophenol under air atmosphere. The combined structure of NiO and Ni-silicate showed the higher activity than pure NiO nanocluster did. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/712/1/012069Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 712
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- 16. international conference on X-ray absorption fine structure
- Acronym
- XAFS16
- Dates
- 23-28 Aug 2015
- Place
- Karlsruhe (Germany)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49018939
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; ACETYLACETONE; AMMONIUM COMPOUNDS; CATALYSTS; COUPLING; FINE STRUCTURE; NANOSTRUCTURES; NICKEL OXIDES; NITRATES; OXIDATION; PRECURSOR; SILICA; SILICATES; SILICON OXIDES; THIOPHENOLS; X-RAY SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; CHELATING AGENTS; CHEMICAL REACTIONS; KETONES; MINERALS; NICKEL COMPOUNDS; NITROGEN COMPOUNDS; ORGANIC COMPOUNDS; ORGANIC SULFUR COMPOUNDS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; REAGENTS; SILICON COMPOUNDS; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS