Published March 2010 | Version v1
Journal article

Directional fluorescence emission characterized with leakage radiation microscopy

  • 1. School of Electrical and Electronic Engineering, Nanyang Technological University, Nanyang Avenue, 639798 (Singapore)
  • 2. Institute of Modern Optics, Key Laboratory of Optoelectronic Information Science and Technology, Ministry of Education of China, Nankai University, Tianjin 300071 (China)
  • 3. Institute of Photonics, University of Science and Technology of China, Hefei, Anhui 230026 (China)

Description

In this paper, leakage radiation microscopy (LRM) was used to characterize the surface plasmon coupled emission (SPCE) and waveguide mode coupled emission (WMCE). Rhodamine (RhB) molecules doping PMMA films with different thicknesses were spin-coated onto silver films deposited on a glass substrate, which were used to generate both the SPCE and WMCE. A numerical simulation was carried out and was consistent with the experimental results, which verifies the feasibility of this method. When compared with a prism-based set-up, LRM has the advantages of getting the emitting angle without scanning and higher spatial resolution

Availability note (English)

Available from http://dx.doi.org/10.1088/2040-8978/12/3/035002

Additional details

Identifiers

DOI
10.1088/2040-8978/12/3/035002;
PII
S2040-8978(10)33675-5;

Publishing Information

Journal Title
Journal of Optics (Online)
Journal Volume
12
Journal Issue
3
Journal Page Range
[4 p.]
ISSN
2040-8986