Published September 2012 | Version v1
Journal article Metadata-only

Local analysis of strontium using fish scale by micro-PIXE with a CdTe X-ray detector

Creators

  • 1. Tokyo Univ., Atmosphere and Ocean Research Inst., International Coastal Research Center, Kashiwa, Chiba (Japan)
  • 2. National Inst. of Radiological Sciences, Research Center for Radiation Protection, Chiba (Japan)
  • 3. National Inst. of Radiological Sciences, Fundamental Technology Center, Chiba (Japan)

Description

Sr is an indicator used in studies on fish migration. In this study, the Sr profiles of ridges, which are growth lines in fish scales, in Sakhalin taimen (Hucho perryi) were examined by micro-PIXE analysis. Sakhalin taimen were reared under freshwater conditions for six months. The ridges that formed during the rearing experiment were subjected to PIXE spot analysis. This analysis was performed in a 5 x 5 μm2 area in the center region of each ridge of the scale section, and the Sr levels were calculated using the thin-section standard. The mean Sr concentration in the ridges was 428 ± 48 μg/g. The quantitative PIXE spot analysis successfully provided Sr profiles for the scale corresponding to ridge formation. (author)

Availability note (English)

Available from http://dx.doi.org/10.1142/S0129083512400256

Additional details

Identifiers

DOI
10.1142/S0129083512400256;

Publishing Information

Journal Title
International Journal of PIXE
Journal Volume
22
Journal Issue
1-2
Journal Page Range
p. 173-178
ISSN
0129-0835

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
46089882
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
CDTE SEMICONDUCTOR DETECTORS; ENDANGERED SPECIES; FISH SCALES; PIXE ANALYSIS; STRONTIUM; X RADIATION; X-RAY DETECTION
Descriptors DEC
ALKALINE EARTH METALS; CHEMICAL ANALYSIS; DETECTION; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; METALS; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; X-RAY EMISSION ANALYSIS

Optional Information

Notes
16 refs., 2 figs., 1 tab.