Published March 18, 2009
| Version v1
Journal article
Large area interference lithography using a table-top extreme ultraviolet laser: a systematic study of the degree of mutual coherence
Creators
- 1. Dipartimento di Fisica, Universita dell'Aquila, gc-LNGS INFN, Via Vetoio, 67100 L'Aquila (Italy)
- 2. Institute of Physical Engineering, Brno University of Technology, Technicka 2, 61669 Brno (Czech Republic)
Description
A prototype low cost table-top Ar capillary discharge laser source (1.5 ns pulse duration, λ = 46.9 nm) was successfully used to produce, by means of interference lithography (with a simple Lloyd mirror setup), large area (0.1 mm2) regular patterns from 400 nm down to 22.5 nm (half-pitch) on PMMA/Si (PMMA: polymethylmethacrylate) substrates. The experiments allowed a systematical investigation of the degree of mutual coherence of the source, giving a clear indication that the interference lithography can be pushed down to the ultimate resolution limit of λ/4.
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-4484/20/11/115303Additional details
Identifiers
- DOI
- 10.1088/0957-4484/20/11/115303;
- PII
- S0957-4484(09)02954-7;
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 20
- Journal Issue
- 11
- Journal Page Range
- [4 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41012679
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- EXTREME ULTRAVIOLET RADIATION; INTERFERENCE; LASERS; NANOSTRUCTURES; PMMA
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ESTERS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; POLYACRYLATES; POLYMERS; POLYVINYLS; RADIATIONS; ULTRAVIOLET RADIATION