Published March 18, 2009 | Version v1
Journal article

Large area interference lithography using a table-top extreme ultraviolet laser: a systematic study of the degree of mutual coherence

  • 1. Dipartimento di Fisica, Universita dell'Aquila, gc-LNGS INFN, Via Vetoio, 67100 L'Aquila (Italy)
  • 2. Institute of Physical Engineering, Brno University of Technology, Technicka 2, 61669 Brno (Czech Republic)

Description

A prototype low cost table-top Ar capillary discharge laser source (1.5 ns pulse duration, λ = 46.9 nm) was successfully used to produce, by means of interference lithography (with a simple Lloyd mirror setup), large area (0.1 mm2) regular patterns from 400 nm down to 22.5 nm (half-pitch) on PMMA/Si (PMMA: polymethylmethacrylate) substrates. The experiments allowed a systematical investigation of the degree of mutual coherence of the source, giving a clear indication that the interference lithography can be pushed down to the ultimate resolution limit of λ/4.

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-4484/20/11/115303

Additional details

Identifiers

DOI
10.1088/0957-4484/20/11/115303;
PII
S0957-4484(09)02954-7;

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
20
Journal Issue
11
Journal Page Range
[4 p.]
ISSN
0957-4484

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41012679
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
EXTREME ULTRAVIOLET RADIATION; INTERFERENCE; LASERS; NANOSTRUCTURES; PMMA
Descriptors DEC
ELECTROMAGNETIC RADIATION; ESTERS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; POLYACRYLATES; POLYMERS; POLYVINYLS; RADIATIONS; ULTRAVIOLET RADIATION