Published June 2001
| Version v1
Journal article
Local structure of Ge/Si (100) self-assembled quantum dots
Creators
- 1. Joint Research Center for Atom Technology-National Institute of Advanced Industrial Science and Technology, Ibaraki (Japan)
- 2. National Institute of Advanced Industrial Science and Technology, Ibaraki (Japan)
- 3. Walter Schttky Institute, Technische Universitat Munchen (Germany)
- 4. Joint Research Center for Atom Technology-Angstrom Technology Partnership, Ibaraki (Japan)
Description
Local structure of uncapped and Si-capped Ge quantum dots grown on Si(100) has been probed by X-ray absorption fine structure spectroscopy. It is found that the uncapped Ge dots are partially oxidized and partially alloyed with Si. The amount of Ge present in the Ge phase is found to be about 20-30%. In the Si-capped sample, Ge present in the Ge phase is found to be about 20-30%. In the Si-capped sample, Ge is found to be dissolved in silicon, the fraction of Ge atoms existing as pure Ge phase being not more than 10%
Additional details
Publishing Information
- Journal Title
- Journal of China University of Science and Technology
- Journal Volume
- 31
- Journal Issue
- 3
- Journal Page Range
- p. 282-288
- ISSN
- 0253-2778
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 35033212
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION; ABSORPTION SPECTROSCOPY; CHEMICAL COMPOSITION; CONCENTRATION RATIO; FINE STRUCTURE; GERMANIUM ALLOYS; GERMANIUM OXIDES; OXIDATION; QUANTUM DOTS; SILICON ALLOYS; STRUCTURAL CHEMICAL ANALYSIS; X RADIATION
- Descriptors DEC
- ALLOYS; CHALCOGENIDES; CHEMICAL REACTIONS; ELECTROMAGNETIC RADIATION; GERMANIUM COMPOUNDS; IONIZING RADIATIONS; NANOSTRUCTURES; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; SORPTION; SPECTROSCOPY