Published November 1, 2012
| Version v1
Journal article
A parametrization of the energy loss distributions of charged particles and its applications for silicon detectors
Creators
- 1. Wigner RCP Institute for Particle and Nuclear Physics, Budapest (Hungary)
Description
The energy loss distribution of charged particles in silicon is approximated by a simple analytical parametrization. Its use is demonstrated through several examples. With the help of energy deposits in sensing elements of the detector, the position of track segments and the corresponding deposited energy are estimated with improved accuracy and less bias. The parametrization is successfully used to estimate the energy loss rate of charged particles, and it is applied to detector gain calibration tasks.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2012.06.064Additional details
Identifiers
- DOI
- 10.1016/j.nima.2012.06.064;
- arXiv
- arXiv:1111.3213v1;
- PII
- S0168-9002(12)00740-1;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 691
- Journal Issue
- Complete
- Journal Page Range
- p. 16-29
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45020261
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACCURACY; APPROXIMATIONS; CALIBRATION; CHARGED PARTICLES; DEPOSITS; DISTRIBUTION; ENERGY LOSSES; PARTICLE TRACKS; SI SEMICONDUCTOR DETECTORS; SILICON
- Descriptors DEC
- CALCULATION METHODS; ELEMENTS; LOSSES; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.