Published September 2013
| Version v1
Journal article
Optical sectioning structured illumination microscopy with enhanced sensitivity
- 1. College of Engineering, University of Georgia, 101 Driftmier Engineering Center, Athens, GA 30602 (United States)
- 2. Department of Plant Biology, University of Georgia, 2502 Miller Plant Sciences, Athens, GA 30602 (United States)
Description
A new approach to reconstructing an optically sectioned image using structured illumination is presented. Compared to the algorithm proposed by Neil et al (1997 Opt. Lett. 22 1905), this method uses the same number of images to construct a final image with a flat linear transfer function at the cost of slightly more complexity in the reconstruction algorithm. Compared to other optical sectioning algorithms using structured illumination, this approach produces images with higher contrast and better image fidelity at low signal intensities. (special issue article)
Availability note (English)
Available from http://dx.doi.org/10.1088/2040-8978/15/9/094004Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Optics (Online)
- Journal Volume
- 15
- Journal Issue
- 9
- Journal Page Range
- [10 p.]
- ISSN
- 2040-8986
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46002126
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ALGORITHMS; COMPARATIVE EVALUATIONS; ILLUMINANCE; IMAGES; OPTICAL MICROSCOPY; OPTICS; SENSITIVITY; TRANSFER FUNCTIONS
- Descriptors DEC
- EVALUATION; FUNCTIONS; MATHEMATICAL LOGIC; MICROSCOPY