Published September 2013 | Version v1
Journal article

Optical sectioning structured illumination microscopy with enhanced sensitivity

  • 1. College of Engineering, University of Georgia, 101 Driftmier Engineering Center, Athens, GA 30602 (United States)
  • 2. Department of Plant Biology, University of Georgia, 2502 Miller Plant Sciences, Athens, GA 30602 (United States)

Description

A new approach to reconstructing an optically sectioned image using structured illumination is presented. Compared to the algorithm proposed by Neil et al (1997 Opt. Lett. 22 1905), this method uses the same number of images to construct a final image with a flat linear transfer function at the cost of slightly more complexity in the reconstruction algorithm. Compared to other optical sectioning algorithms using structured illumination, this approach produces images with higher contrast and better image fidelity at low signal intensities. (special issue article)

Availability note (English)

Available from http://dx.doi.org/10.1088/2040-8978/15/9/094004

Additional details

Publishing Information

Journal Title
Journal of Optics (Online)
Journal Volume
15
Journal Issue
9
Journal Page Range
[10 p.]
ISSN
2040-8986

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46002126
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
ALGORITHMS; COMPARATIVE EVALUATIONS; ILLUMINANCE; IMAGES; OPTICAL MICROSCOPY; OPTICS; SENSITIVITY; TRANSFER FUNCTIONS
Descriptors DEC
EVALUATION; FUNCTIONS; MATHEMATICAL LOGIC; MICROSCOPY