Insitu CCVD grown bilayer graphene transistors for applications in nanoelectronics
Creators
Description
We invented a method to fabricate graphene field effect transistors (GFETs) on oxidized silicon wafers in a Silicon CMOS compatible process. The graphene layers needed are grown in situ by means of a transfer-free catalytic chemical vapor deposition (CCVD) process directly on silicon dioxide. Depending on the process parameters the fabrication of single, double or multi-layer graphene FETs (GFETs) is possible. The produced graphene layers have been characterized by SEM, TEM, TEM-lattice analysis as well as Raman-Spectroscopy. Directly after growth, the fabricated GFETs are electrically functional and can be electrically characterized via the catalyst metals which are used as contact electrodes. In contrast to monolayer graphene FETs, the fabricated bilayer graphene FETs (BiLGFETs) exhibit unipolar p-type MOSFET behavior. Furthermore, the on/off current-ratio of 104 up to several 107 at room temperature of the fabricated BiLGFETs allows their use in digital logic applications [1]. In addition, a stable hysteresis of the GFETs enables their use as memory devices without the need of storage capacitors and therefore very high memory device-densities are possible. The whole fabrication process is fully Si-CMOS compatible, enabling the use of hybrid silicon/graphene electronics.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2013.09.142Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2013.09.142;
- PII
- S0169-4332(13)01806-0;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 291
- Journal Page Range
- p. 83-86
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- The route to post-Si CMOS devices: from high mobility channels to graphene-like 2D nanosheets
- Acronym
- E-MRS 2013 spring meeting symposium I
- Dates
- 27-30 May 2013
- Place
- Strasbourg (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46005151
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CAPACITORS; CATALYSTS; CHEMICAL VAPOR DEPOSITION; GRAPHENE; HYSTERESIS; LAYERS; MEMORY DEVICES; METALS; MOSFET; NANOELECTRONICS; NANOSTRUCTURES; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON; SILICON OXIDES; TEMPERATURE RANGE 0273-0400 K; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- CARBON; CHALCOGENIDES; CHEMICAL COATING; DEPOSITION; ELECTRICAL EQUIPMENT; ELECTRON MICROSCOPY; ELEMENTS; EQUIPMENT; FIELD EFFECT TRANSISTORS; LASER SPECTROSCOPY; MICROSCOPY; MOS TRANSISTORS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; SEMICONDUCTOR DEVICES; SEMIMETALS; SILICON COMPOUNDS; SPECTROSCOPY; SURFACE COATING; TEMPERATURE RANGE; TRANSISTORS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.