Published June 8, 2005
| Version v1
Journal article
Impact of the size 4 cluster on low temperature indium diffusion in silicon
- 1. Emerging Technologies Research Centre, De Montfort University, Leicester LE1 9BH (United Kingdom)
- 2. Silicon Technology Development, Texas Instruments, Dallas, TX 75243 (United States)
Description
Using ab initio density functional theory the configuration space of indium clusters in silicon up to size 4 is explored. The strongest binding energy corresponds to a cluster containing one indium and three self-interstitials. Two plausible configurations almost degenerate in energy are found: the <100> I4 model and an alternative which combines two <110> split di-interstitials. The segregation of indium to a InI4 cluster is found to capture the dual peak and the low temperature annealing behaviour of indium
Availability note (English)
Available online at http://stacks.iop.org/0953-8984/17/S2165/cm5_22_003.pdf or at the Web site for the Journal of Physics. Condensed Matter (ISSN 1361-648X) http://www.iop.org/Additional details
Identifiers
- URL
- http://stacks.iop.org/0953-8984/17/S2165/cm5_22_003.pdf; http://www.iop.org/;
- DOI
- 10.1088/0953-8984/17/22/003;
- PII
- S0953-8984(05)98619-0;
Publishing Information
- Journal Title
- Journal of Physics. Condensed Matter
- Journal Volume
- 17
- Journal Issue
- 22
- Journal Page Range
- p. S2165-S2170
- ISSN
- 0953-8984
- CODEN
- JCOMEL
Conference
- Title
- 1. international workshop on coordination action on defects relevant to engineering silicon-based devices (CADRES)
- Dates
- 26-28 Sep 2004
- Place
- Catania, Sicily (Italy)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36104244
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; ATOMIC CLUSTERS; BINDING ENERGY; CAPTURE; DENSITY FUNCTIONAL METHOD; DIFFUSION; INDIUM; INTERSTITIALS; SEGREGATION; SILICON; TEMPERATURE DEPENDENCE
- Descriptors DEC
- CALCULATION METHODS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTS; ENERGY; HEAT TREATMENTS; METALS; POINT DEFECTS; SEMIMETALS; VARIATIONAL METHODS