Response of CR-39 track detectors to light ions

A series of international collaborative study has been carrying out to obtain the response of CR-39 track detector to light ions. In this work, the depth dependent track etch rates have been estimated of C-12 ions from the growth curves of track length. It was found that the uncertainty in assessing growth rate was one of the most critical factors for error in evaluating the track etch rate. In order to obtain more precise response, we make a simulation study to reconstruct the growth curve from some trial responses. (author)