Published 1976 | Version v1
Book

Induced acceptor levels and free-carrier mobility due to c--screw dislocations in tellurium

  • 1. Lille-1 Univ., 59 - Villeneuve-d'Ascq (France)

Description

Experimental investigations of the influence of c-screw dislocations on the electronic properties of Te are reported. They show that such dislocations introduce an acceptor level inside the bandgap and strongly reduce the free-carrier mobility. Both effects are discussed with respect to three possible mechanisms: deformation potential, piezoelectric potential and core effects, and seem to originate only from the core effects. (author)

Additional details

Publishing Information

Publisher
Institute of Physics.
Imprint Place
Bristol
ISBN
0 85498 121 7
Imprint Title
Radiation effects in semiconductors, 1976. Invited and contributed papers from the international conference on radiation effects in semiconductors held in Dubrovnik, 6-9 September 1976
Journal Issue
no. 31
Series
Institute of Physics Conference Series.
Journal Page Range
p. 478-484.
ISSN
0305-2346

Conference

Title
International conference on radiation effects in semiconductors.
Dates
6 - 9 Sep 1976.
Place
Dubrovnik, Yugoslavia.

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
9370155
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BAND THEORY; CARRIER MOBILITY; DEFORMATION; ELECTRIC CONDUCTIVITY; ELECTRONIC STRUCTURE; ENERGY LEVELS; HALL EFFECT; SCREW DISLOCATIONS; TELLURIUM
Descriptors DEC
CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DISLOCATIONS; ELECTRICAL PROPERTIES; ELEMENTS; LINE DEFECTS; MOBILITY; PHYSICAL PROPERTIES; SEMIMETALS