Published October 30, 2012
| Version v1
Journal article
Optical wave microphone measurement during laser ablation of Si
- 1. Graduate School of Science and Technology, Kumamoto University, 2-39-1 Kurokami, Kumamoto, 860-8555 (Japan)
- 2. Graduate School of Industrial Engineering, Tokai University, 9-1-1 Toroku, Kumamoto, 862-8652 (Japan)
Description
Pulsed laser irradiation is used for surface treatment of a solid and ablation for particle formation in gas, liquid or supercritical phase media. When a pulsed laser is used to irradiate a solid, spatial refractive index variations (including photothermal expansion, shockwaves and particles) occur, which vary depending on the energy density of the pulsed laser. We focused on this phenomenon and applied an unique method for detection of refractive index variation using an optical wave microphone based on Fraunhofer diffraction. In this research, we analyzed the waveforms and frequencies of refractive index variations caused by pulsed laser irradiation of silicon in air and measured with an optical wave microphone.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2012.02.028Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2012.02.028;
- PII
- S0040-6090(12)00156-3;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 521
- Journal Page Range
- p. 132-136
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 3. international conference on microelectronics and plasma technology
- Acronym
- ICMAP2011
- Dates
- 4-7 Jul 2011
- Place
- Dalian (China)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44103659
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABLATION; DIFFRACTION; ENERGY DENSITY; LASER RADIATION; REFRACTIVE INDEX; SHOCK WAVES; SILICON; SURFACE TREATMENTS; WAVE FORMS
- Descriptors DEC
- COHERENT SCATTERING; ELECTROMAGNETIC RADIATION; ELEMENTS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.