Published November 2007
| Version v1
Journal article
Strain compensation by twinning in Au thin films: Experiment and model
- 1. Erich Schmid Institute of Materials Science, Austrian Academy of Sciences and Department Materials Physics, Montanuniversitaet Leoben, Jahnstrasse 12, 8700 Leoben (Austria)
- 2. Max Planck Institute for Metals Research and Institute for Physical Metallurgy, University of Stuttgart, Heisenbergstrasse 3, 70569 Stuttgart (Germany)
- 3. CEMES-CNRS, 29 rue Jeanne Marvig, 31055 Toulouse (France)
- 4. Institute of Mechanics, Montanuniversitaet Leoben, Franz-Josef-Strasse 18, 8700 Leoben (Austria)
Description
Epitaxial Au thin films with thicknesses of 40-160 nm were grown on (1 0 0)-oriented single-crystal NaCl substrates at 300 oC by magnetron sputtering. Microstructural analyses revealed that all films possess orthogonal twin networks along the <0 1 1> directions. The experimentally observed relationship of an increase in twin density with decreasing film thickness is explained by kinematical and thermodynamical modeling. The developed twin model predicts a nanometer-sized width of the twins, in agreement with the experiment
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2007.08.027Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2007.08.027;
- PII
- S1359-6454(07)00575-7;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 55
- Journal Issue
- 19
- Journal Page Range
- p. 6659-6665
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39047824
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- EPITAXY; GOLD; MAGNETRONS; MICROSTRUCTURE; MONOCRYSTALS; SIMULATION; SODIUM CHLORIDES; SPUTTERING; STRAINS; TEMPERATURE RANGE 0400-1000 K; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; TWINNING
- Descriptors DEC
- ALKALI METAL COMPOUNDS; CHLORIDES; CHLORINE COMPOUNDS; CRYSTAL GROWTH METHODS; CRYSTALS; ELECTRON MICROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; HALIDES; HALOGEN COMPOUNDS; METALS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; SODIUM COMPOUNDS; TEMPERATURE RANGE; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.