Published May 12, 2009
| Version v1
Journal article
Influence of Annealing Condition on The Structure and Optical Properties of Na-doped ZnO Thin Films Prepared by Sol-Gel Method
Creators
- 1. Department of Environment and Material Engineering, University of Yantai, Yantai 264005 (China)
- 2. Department of Opt-electric Information Technology, University of Yantai, Yantai 264005 (China)
Description
Na-doped ZnO thin films were deposited on Si (1 0 0) substrates by sol-gel method. X-ray diffraction (XRD) analyses revealed that all the films had a polycrystalline wurtzite structure and high c-axis preferred orientation. PL spectra showed that the thin films produced strong emissions near ultraviolet (UV) and weak, defect-related deep-level emissions in visible regions. In addition, the effects of annealing condition on the structural and optical properties are discussed.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2008.09.127Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2008.09.127;
- PII
- S0925-8388(08)01602-2;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 476
- Journal Issue
- 1-2
- Journal Page Range
- p. 925-928
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41018641
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; DOPED MATERIALS; GRAIN ORIENTATION; OPTICAL PROPERTIES; POLYCRYSTALS; SOL-GEL PROCESS; THIN FILMS; X-RAY DIFFRACTION; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; FILMS; HEAT TREATMENTS; MATERIALS; MICROSTRUCTURE; ORIENTATION; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.