Published June 1996
| Version v1
Journal article
Testing of radiation detectors by IBIC imaging
Creators
- 1. Institut Rudjer Boskovic, Zagreb (Croatia)
- 2. Biochemical Institute, University of Verona, Verona (Italy)
- 3. Experimental Physics Department, University of Torino, Torino (Italy)
Description
The nuclear microprobe technique IBIC (ion beam induced charge) was used for tests of different radiation detectors. By using a 2-6 MeV proton microbeam with a current of less than 1000 protons per second, images and profiles of charge collection efficiency in radiation detectors can be produced. This application of the IBIC technique provides results that can be used to study mobility of charge carriers or inhomogeneities of the electric field inside the depletion region. Presented are examples of IBIC tests performed on CVD diamond, CdTe and Si detectors. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 113
- Journal Issue
- 1-4
- Journal Page Range
- p. 378-381.
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 4. European conference on accelerators in applied research and technology (ECAART-4).
- Dates
- 29 Aug - 2 Sep 1995.
- Place
- Zurich (Switzerland).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 27066275
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CADMIUM TELLURIDES; CARRIER MOBILITY; CDTE SEMICONDUCTOR DETECTORS; CHARGE COLLECTION; DEPLETION LAYER; DIAMONDS; DOPED MATERIALS; EFFICIENCY; ELECTRIC FIELDS; INHOMOGENEOUS FIELDS; ION MICROPROBE ANALYSIS; JUNCTION DETECTORS; JUNCTION DIODES; MEV RANGE 01-10; P-N JUNCTIONS; PROTON BEAMS; PROTON PROBES; PULSES; SI SEMICONDUCTOR DETECTORS; SILICON; SILICON DIODES; SPATIAL DISTRIBUTION; TESTING
- Descriptors DEC
- BEAMS; CADMIUM COMPOUNDS; CARBON; CHALCOGENIDES; CHEMICAL ANALYSIS; DISTRIBUTION; ELEMENTS; ENERGY RANGE; MATERIALS; MEASURING INSTRUMENTS; MEV RANGE; MICROANALYSIS; MINERALS; MOBILITY; NONDESTRUCTIVE ANALYSIS; NONMETALS; NUCLEON BEAMS; PARTICLE BEAMS; PROBES; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMICONDUCTOR JUNCTIONS; SEMIMETALS; TELLURIDES; TELLURIUM COMPOUNDS