Published January 2016 | Version v1
Journal article

Numerical simulation of modulation to incident laser by submicron to micron surface contaminants on fused silica

  • 1. School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu 610054 (China)
  • 2. Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900 (China)

Description

Modulation caused by surface/subsurface contaminants is one of the important factors for laser-induced damage of fused silica. In this work, a three-dimensional finite-difference time-domain (3D-FDTD) method is employed to simulate the electric field intensity distribution in the vicinity of particulate contaminants on fused silica surface. The simulated results reveal that the contaminant on both the input and output surfaces plays an important role in the electric field modulation of the incident laser. The influences of the shape, size, embedded depth, dielectric constant (εr), and the number of contaminant particles on the electric field distribution are discussed in detail. Meanwhile, the corresponding physical mechanism is analyzed theoretically. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-1056/25/1/014210

Additional details

Publishing Information

Journal Title
Chinese Physics. B
Journal Volume
25
Journal Issue
1
Journal Page Range
[8 p.]
ISSN
1674-1056