Published June 25, 2007 | Version v1
Journal article

Interfaces in semiconductor/metal radial superlattices

  • 1. Institute for Integrative Nanosciences, IFW Dresden, Helmholtzstr. 20, D-01069 Dresden (Germany)
  • 2. Max-Planck-Institut fuer Metallforschung, Heisenbergstr. 3, D-70569 Stuttgart (Germany)
  • 3. Max-Planck-Institut fuer Festkoerperforschung, Heisenbergstr. 1, D-70569 Stuttgart (Germany)

Description

Semiconductor/metal radial superlattices are produced by the roll-up of inherently strained InGaAs/Ti/Au as well as InAlGaAs/GaAs/Cr films. Cross sections of the obtained structures are prepared and investigated in detail by diverse transmission electron microscopy as well as microanalysis techniques. Special attention is paid to the interfaces of the semiconductor/metal hybrid superlattice. The study reveals amorphous, noncrystalline layers for the semiconductor/metal as well as for the metal/semiconductor interface. The chemical analysis suggests that the observed interlayers are oxides giving rise to a semiconductor/oxide/metal/oxide superlattice rather than a pure semiconductor/metal superlattice

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
90
Journal Issue
26
Journal Page Range
p. 263107-263107.3
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
(c) 2007 American Institute of Physics