Published August 1, 2000
| Version v1
Report
Application of synchrotron radiation-based X-ray fluorescence microprobe to detect impurities at the location of shunt
Description
no abstract available
Availability note (English)
Available from www.als.lbl.govAdditional details
Publishing Information
- Imprint Pagination
- [vp.]
- Report number
- LBNL/ALS--43452
Conference
- Title
- 10. Workshop on Crystalline Silicon Solar Cell Materials and Processes
- Dates
- 14-16 Aug 2000
- Place
- Copper Mountain, CO (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 33061272
- Subject category
- S14: SOLAR ENERGY; S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- No Abstract, Conference, Non-conventional Literature
- Descriptors DEI
- IMPURITIES; PURIFICATION; SILICON SOLAR CELLS; SYNCHROTRON RADIATION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- BREMSSTRAHLUNG; CHEMICAL ANALYSIS; DIRECT ENERGY CONVERTERS; ELECTROMAGNETIC RADIATION; EQUIPMENT; NONDESTRUCTIVE ANALYSIS; PHOTOELECTRIC CELLS; PHOTOVOLTAIC CELLS; RADIATIONS; SOLAR CELLS; SOLAR EQUIPMENT; X-RAY EMISSION ANALYSIS
Optional Information
- Contract/Grant/Project number
- AC03-76SF00098
- Funding organization
- US Department of Energy (United States)