Verification of a new three - dimensional charge diffusion effect on the X - ray responses of multichannel semiconductor -detector arrays

Extension of our new theory on the x - ray sensitivity of silicon semiconductor detectors is carried out so as to characterize the x - ray response of a multichannel semiconductor detector array fabricated on silicon tip. recently these multichannel detector arrays are widely utilized for position sensitive observations in various research fields; that is, x - ray tomographic reconstructions for measuring electron spatial distribution in fusion - oriented plasma experiments, high energy particle trajectory analyses in elementary particle physics as well as high energy electron orbit - monitors of storage rings in synchrotron radiation facilities. This paper represents the first verification of our recent three dimensional theory on the x - ray response of multichannel semiconductor detector array using synchrotron radiation from a 2.5-GeV positron storage ring at the photon factory (KEK). Enhancement of the x - ray sensitivity of the detector array and the charge diffusion effect on the adjoining detector channel signals are experimentally demonstrated for the first time. These universal important effects disregarded previously are investigated by the comparison between the data and our new theory. 1 fig., 5 refs, (author)