Published December 1978
| Version v1
Journal article
Use of ion implantation in future GaAs technology
Description
Ion implantation has become a standard technique in silicon device fabrication. This paper describes the application of implantation to gallium arsenide processing, which will undoubtedly become increasingly important in future. The review is supported by the author's experimental results from a major UK centre for implantation technology. (author)
Additional details
Publishing Information
- Journal Title
- Microelectron. J.
- Journal Volume
- 9
- Journal Issue
- 2
- Series
- Microelectron. J.
- Journal Page Range
- 13-18
- ISSN
- 0026-2692
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 10431484
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BIBLIOGRAPHIES; CRYSTAL DOPING; FABRICATION; FORECASTING; GALLIUM ARSENIDES; ION IMPLANTATION; REVIEWS; SEMICONDUCTOR DEVICES
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; DOCUMENT TYPES; GALLIUM COMPOUNDS