Published December 1978 | Version v1
Journal article

Use of ion implantation in future GaAs technology

  • 1. Surrey Univ., Guildford (UK)

Description

Ion implantation has become a standard technique in silicon device fabrication. This paper describes the application of implantation to gallium arsenide processing, which will undoubtedly become increasingly important in future. The review is supported by the author's experimental results from a major UK centre for implantation technology. (author)

Additional details

Publishing Information

Journal Title
Microelectron. J.
Journal Volume
9
Journal Issue
2
Series
Microelectron. J.
Journal Page Range
13-18
ISSN
0026-2692

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
10431484
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
BIBLIOGRAPHIES; CRYSTAL DOPING; FABRICATION; FORECASTING; GALLIUM ARSENIDES; ION IMPLANTATION; REVIEWS; SEMICONDUCTOR DEVICES
Descriptors DEC
ARSENIC COMPOUNDS; ARSENIDES; DOCUMENT TYPES; GALLIUM COMPOUNDS