Published October 2006
| Version v1
Journal article
A Test Scheduling Algorithm Based on Two-Stage GA
Creators
- 1. Institute of Automatic Test and Control, Harbin Institute of Technology, Harbin 150001 (China)
Description
In this paper, we present a new algorithm to co-optimize the core wrapper design and the SOC test scheduling. The SOC test scheduling problem is first formulated into a twodimension floorplan problem and a sequence pair architecture is used to represent it. Then we propose a two-stage GA (Genetic Algorithm) to solve the SOC test scheduling problem. Experiments on ITC'02 benchmark show that our algorithm can effectively reduce test time so as to decrease SOC test cost
Availability note (English)
Available online at http://stacks.iop.org/1742-6596/48/658/jpconf6_48_123.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 48
- Journal Issue
- 1
- Journal Page Range
- p. 658-662
- ISSN
- 1742-6596
Conference
- Title
- International symposium on instrumentation science and technology
- Dates
- 8-12 Aug 2006
- Place
- Harbin (China)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38033689
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALGORITHMS; BENCHMARKS; DESIGN; OPTIMIZATION; TESTING
- Descriptors DEC
- MATHEMATICAL LOGIC