High-energy resolution slit-scan radiography: Preliminary results

The peak energy and bandwidth of the x-ray beam spectrum are important when high-contrast (mammography, contrast radiography) or material composition information (dual-energy analysis) are required. Conventional filters offer limited energy selectivity due to exponentially decreasing attentuation above and below the K-edge energy of the filter material. The energy dependence of image contrast is examined in terms of subject composition and thickness. Multilayer x-ray mirrors comprised of alternate layers of high Z and low Z materials can also be used as beam filters. Multilayer alternate layers of high Z and low Z materials can also be used as beam filters. Multilayer deigns are discussed and theoretical reflected spectra are included for a ReW-C multi-layer with a layer pair thickness of 26 A