Published July 2009 | Version v1
Journal article

Time resolved spectroscopy with femtosecond soft-X-ray pulses

  • 1. Friedrich Schiller Universitaet, Institut fuer Optik und Quantenelektronik, Jena (Germany)
  • 2. Universitaet Wuerzburg, Physikalisches Institut, Wuerzburg (Germany)

Description

The most challenging application of time resolved spectroscopy is to directly observe the structural and electronic dynamics. Here we present the combination of X-ray absorption spectroscopy with laser driven X-ray sources, offering atomic spatial and temporal resolution. Our new approaches for optimization of laser driven x-ray sources resulted in the demonstration of spatially coherent sub-20 fs x-ray pulses in a range up to several keV. We excited polycrystalline silicon with an ultrashort laser pulse and characterized the collective motion of atoms with time resolved X-ray absorption spectroscopy at a temporal resolution of less than 20 fs. Finally, we have shown the feasibility of probing the dynamics of the electronic structure of silicon and carbon with near edge X-ray absorption spectroscopy. (orig.)

Availability note (English)

Available from: http://dx.doi.org/10.1007/s00339-009-5176-4

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics. A, Materials Science and Processing
Journal Volume
96
Journal Issue
1
Series
Special issue: Ultrafast X-ray science - probing transient structures in condensed matter
Journal Page Range
p. 43-50
ISSN
0947-8396
CODEN
APAMFC