Published April 2002 | Version v1
Journal article

Development of Si (Li) detectors for charged particles spectrometer

  • 1. Raytech Co. Ltd., Utsunomiya, Tochigi (Japan)
  • 2. National Inst. for Environmental Studies, Tsukuba, Ibaraki (Japan)
  • 3. Tohnic Co. Ltd., Chigasaki, Kanagawa (Japan)
  • 4. Kanagawa Univ., Yokohama, Kanagawa (Japan)

Description

Lithium drifted silicon (Si (Li)) detectors with high-quality large area for charged particles spectrometer abroad artificial satellite have been developed. Surface stability can be obtained by thin p-n junction fabricated with the applied photo engraving process (PEP) instead of surface barrier. The region compensated with Lithium can be improved by the adequate heat treatment, and this improvement can be monitored by means of a combination of copper plating and subsequent micro-XRF analysis. The detectors fabricated from the thermal treated wafers were found to have better energy resolution both for α-particles from 241Am and conversion electrons from 207Bi. (author)

Additional details

Publishing Information

Journal Title
Hoshasen
Journal Volume
28
Journal Issue
2
Journal Page Range
p. 159-167
ISSN
0285-3604

Optional Information

Notes
9 refs., 12 figs.