Density-of-state effective mass and non-parabolicity parameter of impurity doped ZnO thin films
- 1. Thin Film Materials Research Center, Korea Institute of Science and Technology, 39-1, Hawolgok-dong, Sungbuk-gu, Seoul 136-791 (Korea, Republic of)
- 2. LG Electronics Institute of Technology, 16 Woomyeon-dong, Seocho-gu, Seoul 137-724 (Korea, Republic of)
- 3. Division of Materials Science and Engineering, Korea University, 5-1 Anam-Dong, Sungbuk-gu, Seoul 136-701 (Korea, Republic of)
Description
The density-of-state effective masses of impurity doped polycrystalline ZnO thin films were measured by the method of four coefficients technique. By applying the first-order non-parabolicity approximation, the polaron effective mass and the bare band mass at the conduction band minimum, together with the corresponding non-parabolicity parameters, were analysed successfully. The determined perpendicular polaron mass of 0.29 me and the bare band mass of 0.247 me at the conduction band minimum corresponded very well to the previous results obtained for ZnO single crystals. The non-parabolicity parameter of 0.457 eV-1 derived for the polaron effective mass was larger than 0.33 eV-1 which was obtained for the bare band mass due to the increasing function of the Froehlich coupling constant with respect to the bare band mass in polycrystalline ZnO films.
Availability note (English)
Available from http://dx.doi.org/10.1088/0022-3727/41/19/195409Additional details
Identifiers
- DOI
- 10.1088/0022-3727/41/19/195409;
- PII
- S0022-3727(08)84685-2;
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 41
- Journal Issue
- 19
- Journal Page Range
- [5 p.]
- ISSN
- 0022-3727
- CODEN
- JPAPBE
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41008567
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- APPROXIMATIONS; COUPLING CONSTANTS; DOPED MATERIALS; EFFECTIVE MASS; IMPURITIES; MONOCRYSTALS; POLYCRYSTALS; THIN FILMS; ZINC OXIDES
- Descriptors DEC
- CALCULATION METHODS; CHALCOGENIDES; CRYSTALS; FILMS; MASS; MATERIALS; OXIDES; OXYGEN COMPOUNDS; ZINC COMPOUNDS