Published October 13, 2000 | Version v1
Journal article

Spectrometric characterization of amorphous silicon PIN detectors

  • 1. Centro de Estudio Aplicados al Desarrollo Nuclear, P.O. Box 6122, Havana (Cuba)
  • 2. Instituto Nacional de Investigaciones Nucleares, P.O. Box 19-1027, Mexico D.F. (Mexico)
  • 3. Seccion de Electronica del Estado Solido, Depto. de Ingenieria Electrica, CINVESTAV-IPN, P.O. Box 14 740, Mexico D.F. (Mexico)

Description

During the last years, much interest has been dedicated to the use of amorphous silicon PIN diodes as particle and radiation detectors for medical applications. This work presents the spectrometric characterization of PECVD high deposition rate diodes fabricated at our laboratory, with thickness up to 17.5 μm. Results show that the studied devices detect the Am241 alpha particles and the medical X-rays generated by a mammograph model Senographe 700T from General Electric Possible reasons of the observed energy losses are discussed in the text. Using the SRIM2000 program, the transit of 5.5 MeV alpha particles through a diode was simulated, determining the optimum thickness for these particles to deposit their energy in the intrinsic layer of the diode

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
538
Journal Issue
1
Journal Page Range
p. 201-205
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
4. Mexican symposium on medical physics
Dates
1-3 Mar 2000
Place
Merida, Yucatan (Mexico)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
34067638
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S62: RADIOLOGY AND NUCLEAR MEDICINE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BIOMEDICAL RADIOGRAPHY; IMAGE PROCESSING; MAMMARY GLANDS; RADIATION DETECTORS; SEMICONDUCTOR DIODES; X-RAY DETECTION
Descriptors DEC
BODY; DETECTION; DIAGNOSTIC TECHNIQUES; GLANDS; MEASURING INSTRUMENTS; MEDICINE; NUCLEAR MEDICINE; ORGANS; PROCESSING; RADIATION DETECTION; RADIOLOGY; SEMICONDUCTOR DEVICES

Optional Information

Notes
(c) 2000 American Institute of Physics.