Solution-processed polycrystalline silicon on paper
Creators
- 1. Delft Institute for Microsystems and Nanoelectronics (DIMES), Delft University of Technology, Feldmannweg 17, 2628CT Delft (Netherlands)
- 2. Japan Advanced Institute of Science and Technology, Nomi, Ishikawa 923-1292 (Japan)
Description
Printing electronics has led to application areas which were formerly impossible with conventional electronic processes. Solutions are used as inks on top of large areas at room temperatures, allowing the production of fully flexible circuitry. Commonly, research in these inks have focused on organic and metal-oxide ink materials due to their printability, while these materials lack in the electronic performance when compared to silicon electronics. Silicon electronics, on the other hand, has only recently found their way in solution processes. Printing of cyclopentasilane as the silicon ink has been conducted and devices with far superior electric performance have been made when compared to other ink materials. A thermal annealing step of this material, however, was necessary, which prevented its usage on inexpensive substrates with a limited thermal budget. In this work, we introduce a method that allows polycrystalline silicon (poly-Si) production directly from the same liquid silicon ink using excimer laser irradiation. In this way, poly-Si could be formed directly on top of paper even with a single laser pulse. Using this method, poly-Si transistors were created at a maximum temperature of only 150 °C. This method allows silicon device formation on inexpensive, temperature sensitive substrates such as polyethylene terephthalate, polyethylene naphthalate or paper, which leads to applications that require low-cost but high-speed electronics
Additional details
Identifiers
- DOI
- 10.1063/1.4916998;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 106
- Journal Issue
- 16
- Journal Page Range
- p. 163502-163502.4
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46104634
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANNEALING; COMPARATIVE EVALUATIONS; EXCIMER LASERS; INKS; LASER RADIATION; LIQUIDS; OXIDES; POLYCRYSTALS; POLYESTERS; POLYETHYLENES; PROCESS SOLUTIONS; PULSED IRRADIATION; SILICON; SUBSTRATES; TEMPERATURE RANGE 0273-0400 K; TRANSISTORS; VELOCITY
- Descriptors DEC
- CHALCOGENIDES; CRYSTALS; DISPERSIONS; ELECTROMAGNETIC RADIATION; ELEMENTS; ESTERS; EVALUATION; FLUIDS; GAS LASERS; HEAT TREATMENTS; HOMOGENEOUS MIXTURES; IRRADIATION; LASERS; MIXTURES; ORGANIC COMPOUNDS; ORGANIC POLYMERS; OXYGEN COMPOUNDS; POLYMERS; POLYOLEFINS; RADIATIONS; SEMICONDUCTOR DEVICES; SEMIMETALS; SOLUTIONS; TEMPERATURE RANGE
Optional Information
- Notes
- (c) 2015 AIP Publishing LLC