Published March 2007 | Version v1
Journal article

In situ angle-resolved photoemission study of half-metallic La0.6Sr0.4MnO3 thin films

  • 1. Department of Applied Chemistry, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656 (Japan)
  • 2. Department of Complexity Science and Engineering and Department of Physics, University of Tokyo, Kashiwa 277-8561 (Japan)
  • 3. Department of Physics, Tokyo University of Science, Chiba 278-8510 (Japan)
  • 4. Institute for Solid State Physics, University of Tokyo, Kashiwa 277-8581 (Japan)
  • 5. Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK), Tsukuba 305-0801 (Japan)
  • 6. Institute for Materials Research, Tohoku University, Sendai 980-8577 (Japan)
  • 7. National Institute for Materials Science, Tsukuba 305-0047 (Japan)

Description

We have performed an in situ angle-resolved photoemission spectroscopy (ARPES) on single-crystal surfaces of La0.6Sr0.4MnO3 (LSMO) thin films to investigate the electronic structure near the Fermi level (EF). ARPES spectra near EF reveal the existence of a dispersive Mn-3d derived conduction band indicative of an electron pocket centered at the Γ point. Comparing the experimental band structure with the local density approximation + U band-structure calculation, the estimated size of the Fermi surface is consistent with the prediction of the calculation, while the measured bandwidth is significantly narrower than the calculation. The discrepancy between the two suggests that the renormalization effect is significant due to the strong electron correlation in LSMO

Additional details

Identifiers

DOI
10.1016/j.jmmm.2006.10.226;
PII
S0304-8853(06)01411-9;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
310
Journal Issue
2
Journal Page Range
p. 1030-1032
ISSN
0304-8853
CODEN
JMMMDC

Conference

Title
17. international conference on magnetism
Dates
20-25 Aug 2006
Place
Kyoto (Japan)

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.