Numerical simulation of fluctuation measurements by reflectometry
Creators
- 1. Commission of the European Communities, Abingdon (United Kingdom). JET Joint Undertaking
Description
A full wave, one dimensional, model of the phase response of reflectometers to density fluctuations is presented. The model is based on obtaining numerical solutions to the electromagnetic wave equation in a turbulent dielectric medium using a differencing method. In order to test the accuracy of the model, its results are compared with analytic solutions of the wave equation. The model is used to determine the phase response of a single channel reflectometer and a two channel correlation reflectometer to density fluctuations. For the single channel device, it is concluded that it is only possible to obtain qualitative information on the density fluctuations. However, for the two channel correlation reflectometer it is shown that it is possible to determine, under certain conditions, the radial dispersion relation of the fluctuations and the radial correlation lengths. (author). 4 refs, 15 figs
Additional details
Publishing Information
- Imprint Title
- Microwave reflectometry for fusion plasma diagnostics
- Imprint Pagination
- 264 p.
- Journal Page Range
- p. 68-78.
- Report number
- INIS-mf--13810
Conference
- Title
- IAEA technical committee meeting on microwave reflectometry for fusion plasma diagnostics.
- Dates
- 4-6 Mar 1992.
- Place
- Abingdon (United Kingdom).
INIS
- Country of Publication
- International Atomic Energy Agency (IAEA)
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 25027114
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- ENERGY SPECTRA; FLUCTUATIONS; MICROWAVE EQUIPMENT; NUMERICAL ANALYSIS; ONE-DIMENSIONAL CALCULATIONS; PLASMA DIAGNOSTICS; REFLECTION; THEORETICAL DATA; TURBULENCE; WAVE PROPAGATION
- Descriptors DEC
- DATA; ELECTRONIC EQUIPMENT; EQUIPMENT; INFORMATION; MATHEMATICS; NUMERICAL DATA; SPECTRA; VARIATIONS