Absorption edge parameters of the L_III edge for compounds of Hg, Tl, Pb and Bi using EDXRF technique

Highlights: • Absorption edge parameters measured for elements compounds of Hg, Tl, Pb and Bi. • EDXRF technique is used for the measurements. • Maximum variation of absorption edge parameters is observed for chloride compounds. • The overall error in the experimental values of various parameters is within 3.5%. - Abstract: The measurement of Absorption edge parameters of the $L_{\mathrm{III}}$ edge of pure elements Hg, Tl, Pb and Bi along with their compounds HgCl₂, HgO, HgF₂, TlCl, Tl₂O₃, PbCl₂, PbF₂, Pb₃O₄, BiF₃, BiCl₃ and Bi₂O₃ has been done using EDXRF technique. In the present measurements ²⁴¹Am (59.54 keV) radioactive source of activity 100 mCi along with CANBERRA make cryo-cooled Si (Li) detector is used. The measured results are compared with theoretically calculated values from FFAST version 2.1 (Chantler et al., 2005) and shows good agreement with each other within experimental uncertainties within 3.5%. It is observed that the values of absorption edge parameters of the L_III edge depends slightly on the chemical environment and shows almost constant behaviour with effective atomic number ($Z_{\mathrm{eff}}$)