Electron energy loss spectroscopy of thin film electrodes and membranes in all-solid-state batteries
- 1. Institut fuer Materialphysik, Westf. Wilhelms-Universitaet Muenster, Wilhelm-Klemm-Str.10, 48149 Muenster (Germany)
Description
Electron energy loss spectroscopy (EELS) is based on inelastic scattering of electrons in the TEM. The technique allows evaluating the chemical composition, the oxidation states and therefore, also the bonding characteristics of layered samples with a spatial resolution in the nanometer range. For the experiments, model batteries comprising of layers of LiCoO2, Li-Borate glasses and V2O5 are deposited onto ITO-coated glass substrates. Single layer thickness ranges from 50 to 400 nm. Electron transparent cross section samples are prepared by conventional ion milling and FIB technique. Measuring the observed chemical shift in the absorption edges of the energy loss spectra and comparing these to appropriate reference materials, different charge states of the electrodes can be distinguished and the amount of Li intercalated in the structure is quantified. The talk demonstrates how these data are used to optimize the conditions of sputter deposition and to achieve suitable functional properties of the thin films. Reversible Li-intercalation in the model thin film battery with active layers of 200 nm thickness and 50 nm thick membranes is demonstrated by cyclic voltametry.
Additional details
Identifiers
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Issue
- Regensburg 2010 issue
- Series
- Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 45(3)
- Journal Page Range
- [1 p.]
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- DPG Spring meeting 2010 of the condensed matter section with the divisions biological physics, chemical and polymer physics, crystallography, dielectric solids, dynamics and statistical physics, low temperature physics, magnetism, metal and material physics, physics of socio-economic systems, radiation and medical physics, semiconductor physics, surface science, thin films, vacuum science and technology as well as the working group industry and business, with job market, symposia, teachers' days, tutorials, exhibition of scientific instruments and literature
- Dates
- 21-26 Mar 2010
- Place
- Regensburg (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 42061565
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BORATES; CHARGE STATES; CHEMICAL BONDS; CHEMICAL COMPOSITION; CHEMICAL SHIFT; CLATHRATES; COATINGS; COBALT OXIDES; DEPOSITION; ELECTRODES; ELECTRON SPECTRA; ENERGY LOSSES; ENERGY SPECTRA; GLASS; IRIDIUM OXIDES; LAYERS; LITHIUM OXIDES; MEMBRANES; OPTIMIZATION; SPECTRAL SHIFT; SPUTTERING; SUBSTRATES; THIN FILMS; TIN OXIDES; TRANSMISSION ELECTRON MICROSCOPY; VANADIUM OXIDES
- Descriptors DEC
- ALKALI METAL COMPOUNDS; BORON COMPOUNDS; CHALCOGENIDES; COBALT COMPOUNDS; ELECTRON MICROSCOPY; FILMS; IRIDIUM COMPOUNDS; LITHIUM COMPOUNDS; LOSSES; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; REFRACTORY METAL COMPOUNDS; SPECTRA; TIN COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; VANADIUM COMPOUNDS
Optional Information
- Notes
- Session: MM 57.3 Do 14:45; No further information available