Use of the method of images in studying the energy spectra of the surface states of electrons or holes in three-layer semiconductor-dielectric-conductor structures

For the potentials obtained by the method of images, we have found the surface states of an electron or a hole in three-layer semiconductor-dielectric-conductor structures. For the arbitrarily thin layer of a dielectric, we deduced the exact formulas for the energy spectra En by the method of effective mass and with regard for the discreteness of the crystal lattice of a semiconductor