Published September 1972 | Version v1
Journal article Metadata-only

Potential measurement and stabilization of an isolated target using electron beams

Creators

  • 1. Massachusetts Inst. of Tech., Cambridge (USA)

Description

no abstract available

Additional details

Identifiers

DOI
10.1016/0038-1101(72)90140-2;

Publishing Information

Journal Title
Solid-State Electronics
Journal Volume
15
Journal Issue
9
Series
Solid-State Electron.
Journal Page Range
987-992
ISSN
0038-1101

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
4035484
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ACCURACY; ELECTRIC CONTACTS; ELECTRIC POTENTIAL; ELECTRON BEAMS; ELECTRONIC CIRCUITS; MEASURING INSTRUMENTS; MICROELECTRONICS; MOCKUP; NONDESTRUCTIVE TESTING; PERFORMANCE; SECONDARY EMISSION; SEMICONDUCTOR DEVICES; SIGNALS; STABILITY; SURFACES; TARGETS
Descriptors DEC
BEAMS; ELECTRICAL EQUIPMENT; EMISSION; LEPTON BEAMS; MATERIALS TESTING; PARTICLE BEAMS; STRUCTURAL MODELS; TESTING

Optional Information

Notes
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