Published July 1, 1979
| Version v1
Journal article
Direct methods of analyzing diffuse scattering
Creators
- 1. Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439
Description
Methods of analysis of diffuse scattering have now reached the stage where thee are well tested and documented standard procedures for a variety of materials, and software, for both x-rays and neutrons. These methods and their meaning Are briefly reviewed
Additional details
Publishing Information
- Journal Title
- AIP (Am. Inst. Phys.) Conf. Proc.
- Journal Volume
- 53
- Journal Issue
- 1
- Series
- AIP (Am. Inst. Phys.) Conf. Proc.
- Journal Page Range
- 21-29
- ISSN
- 0094-243X
Conference
- Title
- International conference on modulated structures.
- Dates
- 22 - 25 Mar 1979.
- Place
- Kailua-Kona, HI, USA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 11511772
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYSTAL STRUCTURE; CRYSTALS; DEBYE-WALLER FACTOR; LATTICE VIBRATIONS; NEUTRON DIFFRACTION; PATTERSON METHOD; POLARIZATION; ROUGHNESS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; SCATTERING; SURFACE PROPERTIES
Optional Information
- Secondary number(s)
- CONF-790341--.