Published January 11, 2009 | Version v1
Journal article Metadata-only

Beam performance of tracking detectors with industrially produced GEM foils

Creators

  • 1. Excellence Cluster Universe, Technische Universitaet Muenchen, Garching (Germany)
  • 2. Max-Planck-Institut fuer Physik, Muenchen (Germany)
  • 3. Laboratory for Nuclear Science, Massachusetts Institute of Technology, Cambridge, MA (United States)
  • 4. Hampton University, Hampton, VA (United States)
  • 5. Physics Department, Yale University, New Haven, CT (United States)
  • 6. Argonne National Laboratory, Argonne, IL (United States)

Description

Three Gas-Electron-Multiplier (GEM) tracking detectors with an active area of 10cmx10cm and a two-dimensional, laser-etched orthogonal strip readout have been tested extensively in particle beams at the Meson Test Beam Facility at Fermilab. These detectors used GEM foils produced by Tech-Etch, Inc. They showed an efficiency in excess of 95% and spatial resolution better than 70μm. The influence of the angle of incidence of particles on efficiency and spatial resolution was studied in detail.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2008.09.041

Additional details

Identifiers

DOI
10.1016/j.nima.2008.09.041;
arXiv
arXiv:0808.3477v2;
PII
S0168-9002(08)01440-X;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
598
Journal Issue
2
Journal Page Range
p. 432-438
ISSN
0168-9002
CODEN
NIMAER

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41028850
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
EFFICIENCY; ELECTRON MULTIPLIERS; FERMILAB; FOILS; INCIDENCE ANGLE; LASERS; MESONS; PARTICLE BEAMS; PERFORMANCE; RADIATION DETECTORS; READOUT SYSTEMS; SPATIAL RESOLUTION; TWO-DIMENSIONAL CALCULATIONS
Descriptors DEC
BEAMS; BOSONS; ELECTRON TUBES; ELEMENTARY PARTICLES; HADRONS; MEASURING INSTRUMENTS; NATIONAL ORGANIZATIONS; RESOLUTION; US DOE; US ORGANIZATIONS

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.